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Monday, July 13, 2020 | History

1 edition of Performance and reliability of semiconductor devices found in the catalog.

Performance and reliability of semiconductor devices

Symposium A, "Performance and Reliability of Semiconductor Devices" (2008 Boston, Mass.)

Performance and reliability of semiconductor devices

symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.

by Symposium A, "Performance and Reliability of Semiconductor Devices" (2008 Boston, Mass.)

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  • 29 Currently reading

Published by Materials Research Society in Warrendale, Pa .
Written in English

    Subjects:
  • Semiconductors,
  • Reliability,
  • Congresses,
  • Defects

  • Edition Notes

    Statementeditors, Michael Mastro ... [et al.].
    SeriesMaterials Research Society symposium proceedings -- v. 1108, Materials Research Society symposia proceedings -- v. 1108.
    ContributionsMastro, Michael, 1949-, Materials Research Society, Materials Research Society. Meeting
    Classifications
    LC ClassificationsTK7871.85 .S952 2008
    The Physical Object
    Paginationxiii, [3], 259 p. :
    Number of Pages259
    ID Numbers
    Open LibraryOL25006136M
    ISBN 101605110809
    ISBN 109781605110806
    LC Control Number2011288314
    OCLC/WorldCa320436779

    2 days ago  The article explains how the package in which the GaN device is attached, and the method used to attach the device to the package, can optimise the device's efficiency, performance, and reliability. "The success of the package's performance is dependent on the base material used, the quality of the package construction, and the attachment process. Power Semiconductor Devices are crucial components in present day power electronic systems. The performance and efficiency of the devices have a direct correlation with the power system efficiency. This dissertation will examine some of the components that are commonly used in a power system, with emphasis on their performance characteristics and reliability.

    semiconductor devices were very aggressively scaled down. Since then, the IC industry has put a lot of effort into understanding and characterizing failure mechanisms. Nowadays, most of the problems can be addressed by design-in of reliability with the device lifetime goal set at several decades. Most of the. This book is the fourth in a series of RAC data publications dealing with discrete semiconductor device reliability. It offers a detailed presentation of transistor, diode and optoelectronic device failure experience data as well as failure mode and mechanism information.

    Neamen's Semiconductor Physics and Devices, Third Edition. deals with the electrical properties and characteristics of semiconductor materials and devices. The goal of this book is to bring together quantum mechanics, the quantum theory of solids, semiconductor material physics, and semiconductor device physics in a clear and understandable way. performance characteristics within specified limits. • Fitness for use. Reliability is defined as: • Quality in time and environment (temperature, voltage, etc.). • The probability that a semiconductor device, which initially has satisfactory performance, will continue to perform. its intended function for a given time under actual usage.


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Performance and reliability of semiconductor devices by Symposium A, "Performance and Reliability of Semiconductor Devices" (2008 Boston, Mass.) Download PDF EPUB FB2

Despite the rapid development in semiconductor-based devices, there exist fundamental materials and physics issues that limit the reliability and performance of optoelectronic and electronic devices. This book examines the latest technical advancements and emerging trends in semiconductor materials and devices.

The Performance and reliability of semiconductor devices book Nitride Electronic Devices chapter offers an overview of the state-of. Performance and Reliability of Semiconductor Devices. Symposium on Performance and Reliability of Semiconductor Devices ( Boston, MA).

by Michael Mastro et al. Materials Research Society pages $ Hardcover Materials Research Society symposium proceedings; v TK   Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability through a focus on case studies and structured methods.

The book provides a brief look at the fundamentals of laser diodes and presents real world case studies that discuss the principles of reliability and what occurs when rules are Edition: 1. Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging.

With a focus on statistically predicting failure and product yields, this book can help the design engineer /5(7). This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

Diode laser fundamentals are discussed, followed by an. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices.

The availability of power semiconductor devices using silicon carbide and gallium nitride technology have pushed integration density and efficiency to a new level beyond the capability of silicon devices by allowing for higher switching frequencies.

Performance Measurement and Reliability Evaluation this book is a timely resource on the. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices.

These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Semiconductor power devices are the heart of power electronics.

They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles. 2 Reliability of Semiconductor Devices TCE-2 b)Purposes and types of reliability test For semiconductor devices, the reliability test is performed at each stage of development and mass production.

When a semiconductor device is developed, the reliability test will be performed to check the design, material, and process. Wide Bandgap Semiconductor Power Devices: Materials, Physics, Design and Applications provides readers with a single resource on why these devices are superior to existing silicon devices.

The book lays the groundwork for an understanding of an array of. Reliability of semiconductor devices can be summarized as follows: Semiconductor devices are very sensitive to impurities and particles.

Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The thermal performance of semiconductor devices is most often specified according to JEDEC standards JESD51 which describes precisely how various steady-state.

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth.

Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in 5/5(1). This book was written for students and for engineers working in the field of power device design and power electronics application.

The focus was set on mod-ern semiconductor switches such as power MOSFETs and IGBTs together with the essential freewheeling diodes. The engineer in practice may start his work with the.

Performance and reliability of semiconductor devices: symposium held November December 3,Boston, Massachusetts, U.S.A. One great book to start with is Neamen's Semiconductor Physics and Devices.

It's written in an easygoing tone and very readable, and it covers everything from basic solid-state physics to transport behavior (e.g., drift-diffusion) to all kinds of. Massimo Rudan received a degree in Electrical Engineering in and a degree in Physics inboth from the University of Bologna, Italy.

His research interests are in the field of physics of carrier transport and numerical analysis of semiconductor devices. Inhe was a visiting scientist, on a one-year assignment, at the IBM Thomas J.

Watson Research Center at Yorktown Heights, NY. Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency.

Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Most semiconductor devices have lifetimes that extend over many years at normal use.

However, we cannot wait years to study a device; we have to increase the applied stress. Applied stresses enhance or accelerate potential fail mechanisms, help identify the root. Abstract: For power thyristor devices used in high voltage direct current (HVDC) schemes, hermetic packages are still being used despite plastic packaging having made successful progress towards replacing them in various high reliability applications, e.g.

aerospace and military. Although hermetic technologies have demonstrated an excellent history of reliability and performance, they offer.A further two books in the series will describe the fundamentals of CAAC-IGZO, and the application to LSI devices.

Key features: • Introduces different oxide semiconductor field-effect transistor designs and their impact on the reliability and performance of LCDs and OLED displays, both in pixel and panel-integrated driving circuits.

Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e.